This article relates to handheld instruments with scanning capability:
X-Rite I1 Pro, X-Rite eXact with Scan option, Techkon SpectroDense, Konica Minolta Myiro-1 ...
Instruments with rail (Intellitrax, eXact Auto-Scan, Techkon SepctroDrive), XY devices ( X-Rite iSis, I1Io, Myiro-9, Barbieri LFP) control instrument position based on additional information coming from the driving mechanism and sometimes integrated autopositioning solutions (Internal scanner, camera...)
A scan mode is a specific measurement scenario when the instrument is capturing data continuously. When moving manually speed, aperture, and patch size are determining the number of samples per patch. Instrument analyses samples that belong to the same patch. Some measurements have to be excluded - it is the result of mixing, the rest have to be consistent enough to detect it, then average them.
When creating a scanning template it is critical to design control strip size for a given instrument taking into account the relationship described below.

The aperture/patch width ratio is better for a smaller aperture

A wider patch to aperture ratio is better than for shorter patch.
Case A — number of captured samples makes analysis effective.
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SCANNING |
| RAW DATA | |
| ANALYSIS | |
| GROUPING | |
| AVERAGING |
Case B — Scanning speed too fast

There is no sufficient data for averaging - algorithm struggle with recognition
Case C — Patch width – too short

There is no sufficient data for averaging - algorithm struggle with recognition
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