Substrate Inspector
ChromaChecker Substrate Inspector analyses and tracks all substrate properties that affect how color is perceived in the printing industry — from spectral reflectance and whiteness to gloss, thickness, and basis weight.
What You Need
To use Substrate Inspector, you need:
- A supported spectrophotometer — X-Rite i1Pro 2/3, eXact, Techkon SpectroDens, X-Rite i1iO, NIX Spectro 2, or Variable Spectro 1
- CC Measurement Backer (black/white backing per ISO measurement standards)
- CC Capture with valid operator credentials
Measured Properties
A full substrate characterisation includes spectral reflectance data measured under multiple M-conditions (M0, M1, M2) to capture the effect of optical brightening agents (OBAs). ChromaChecker stores the full spectral dataset — not just L*a*b* — enabling accurate prediction of how the substrate affects printed color under different illuminants.
Key substrate parameters tracked in the library:
- CIE Whiteness and Brightness (ISO, TAPPI)
- L*a*b* and spectral data on white and black backing
- OBA/Fluorescence index per M-condition
- Opacity
- Gloss (75° TAPPI, 20°/60° ISO)
- Thickness (caliper)
- Basis weight (grammage)
Additional Hardware
For a complete substrate characterisation beyond spectral data, the following instruments integrate with CC Capture:
